Vacuum Mass Comparator

National Metrology Institutes improve measurement accuracy using the reference in vacuum mass determination: The METTLER Toledo M_one and M_10 evaluate various artifacts and results up to 10 nanograms accuracy and offer unique flexibility features. Determine the mass of weights, artifacts and silicon spheres up to 1 kilogram, respectively 10 kilograms from controlled ambient pressure down to vacuum at 10-6 mbar. Load the artifacts directly through the quick loading door or through the Load-Lock system. The Windows®-based M_Control software accompanies the customer during the whole process.